Friction and pull-off forces on submicron-size asperities measured in high-vacuum and in both dry and humid nitrogen at atmospheric pressure

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 43, Issue 7 B, 2004, Pages 4506-4510

  Ando, Yasuhisa ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Atomic force microscope; Capillary; Focused ion beam; Laplace pressure; Viscosity

Indexed keywords

ATMOSPHERIC HUMIDITY; ATMOSPHERIC PRESSURE; ATOMIC FORCE MICROSCOPY; CAPILLARITY; ION BEAMS; LAPLACE TRANSFORMS; MICROSTRUCTURE; NITROGEN; ULTRAHIGH VACUUM;

ASPERITIES; FOCUSED ION BEAMS; FRICTION FORCE GRADIENT; LAPLACE PRESSURE; RADIUS OF CURVATURE;

FRICTION;

EID: 5144226153     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.43.4506     Document Type: Conference Paper

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