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Volumn , Issue , 2008, Pages 1679-1683

Fracture behaviour of adhesive bonds by different shear speed

Author keywords

[No Author keywords available]

Indexed keywords

ABS RESINS; BUILDING MATERIALS; COMPUTER NETWORKS; ELECTRONICS PACKAGING; PHOTORESISTS; POLYMERS; SPEED;

EID: 51349167386     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECTC.2008.4550204     Document Type: Conference Paper
Times cited : (3)

References (9)
  • 3
    • 35348882599 scopus 로고    scopus 로고
    • High-Speed Solder Ball Shear and Pull Tests vs. Board Level Mechanical Drop Tests: Correlation of Failure Mode and Loading Speed
    • May 29, June 1, Reno, Nevada USA
    • Song, F.; Lee, S. W. R.; Newman, K.; Sykes, B.; Clark,S.: "High-Speed Solder Ball Shear and Pull Tests vs. Board Level Mechanical Drop Tests: Correlation of Failure Mode and Loading Speed"; The 57th Electronic Components and Technology Conference, May 29 - June 1,2007 Reno, Nevada USA
    • (2007) The 57th Electronic Components and Technology Conference
    • Song, F.1    Lee, S.W.R.2    Newman, K.3    Sykes, B.4    Clark, S.5
  • 4
    • 51349110908 scopus 로고    scopus 로고
    • JESD22-B110 (Ausgabe 2004-11), Subassembly Mechanical Shock
    • JESD22-B110 (Ausgabe 2004-11), Subassembly Mechanical Shock
  • 5
    • 51349127781 scopus 로고    scopus 로고
    • JESD22-B117 (Ausgabe:2000-07), BGA Ball Shear
    • JESD22-B117 (Ausgabe:2000-07), BGA Ball Shear
  • 6
    • 51349109715 scopus 로고    scopus 로고
    • JESD22-B111 (Ausgabe:2003-07), Board Level Drop Test Method of Components for Handheld Electronic Products
    • JESD22-B111 (Ausgabe:2003-07), Board Level Drop Test Method of Components for Handheld Electronic Products
  • 8
    • 51349111354 scopus 로고    scopus 로고
    • DIN EN ISO 10365 (Ausgabe 1995-08); Klebstoffe -Bezeichnung der wichtigsten Bruchbilder
    • DIN EN ISO 10365 (Ausgabe 1995-08); Klebstoffe -Bezeichnung der wichtigsten Bruchbilder
  • 9
    • 35348832874 scopus 로고    scopus 로고
    • Brittle Failure Mechanism of SnAgCu and SnPb Solder Balls during High Speed Ball Shear and Cold Ball Pull Tests
    • May 29, June 1, Reno, Nevada USA
    • Song, F.; Lee, S. W. R.; Newman, K.; Sykes, B.; Clark,S.: Brittle Failure Mechanism of SnAgCu and SnPb Solder Balls during High Speed Ball Shear and Cold Ball Pull Tests, The 57th Electronic Components and Technology Conference, May 29 - June 1, 2007 Reno, Nevada USA.
    • (2007) The 57th Electronic Components and Technology Conference
    • Song, F.1    Lee, S.W.R.2    Newman, K.3    Sykes, B.4    Clark, S.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.