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Volumn , Issue , 2008, Pages 63-67

PC board thermal management of high power LEDs

Author keywords

Board thermal resistance; Closely or densely packed LEDs; FR4 filled and capped vias; PC board reliability; PC board thermal management; Power LEDs; Solder joint reliability

Indexed keywords

COMPUTER NETWORKS; COST EFFECTIVENESS; DC GENERATORS; ELECTRIC CONDUCTIVITY; ELECTRONIC EQUIPMENT MANUFACTURE; PRINTED CIRCUIT BOARDS; PRINTED CIRCUIT MANUFACTURE; PRINTED CIRCUITS; RELIABILITY; SEMICONDUCTOR MATERIALS; TEMPERATURE CONTROL; THERMAL VARIABLES CONTROL; THERMAL VARIABLES MEASUREMENT; WELDING;

EID: 51349164959     PISSN: 10652221     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/STHERM.2008.4509368     Document Type: Conference Paper
Times cited : (14)

References (11)
  • 3
    • 51349111793 scopus 로고    scopus 로고
    • Technical Datasheet DS56, Philips Philips Lumileds Lighting website, 2007.
    • Technical Datasheet DS56, Philips Philips Lumileds Lighting website, 2007.
  • 4
    • 51349163568 scopus 로고    scopus 로고
    • Application Brief AB32, Philips Lumileds Lighting website, 2007.
    • Application Brief AB32, Philips Lumileds Lighting website, 2007.
  • 5
    • 51349134117 scopus 로고    scopus 로고
    • Texas Instrument,: PowerPADTM Thermally Enhanced Package, SLMA002A-Novermber 1997-Revised June 2006.
    • Texas Instrument,:" PowerPADTM Thermally Enhanced Package", SLMA002A-Novermber 1997-Revised June 2006.
  • 6
    • 51349128225 scopus 로고    scopus 로고
    • IPC 2315, IPC2226 and IPC4761 norm.
    • IPC 2315, IPC2226 and IPC4761 norm.
  • 7
    • 85009856964 scopus 로고    scopus 로고
    • Built-in Reliability: Optimization of the Desmear and Metallization Processes for Use on High Frequency and Lead-Free Laminate Materials
    • Carano, M., L. Burger:" Built-in Reliability: Optimization of the Desmear and Metallization Processes for Use on High Frequency and Lead-Free Laminate Materials", CircuiTree, 2006.
    • (2006) CircuiTree
    • Carano, M.1    Burger, L.2
  • 10
    • 0028368687 scopus 로고
    • Plated through hold reliability in printed circuit boards which utilize direct power/ground plane interconnection
    • Fauser, S. et al.:" Plated through hold reliability in printed circuit boards which utilize direct power/ground plane interconnection", International Journal of Microcircuit and Electronic Packaging, volume 17, no. 2, pp.127-134, 1994.
    • (1994) International Journal of Microcircuit and Electronic Packaging , vol.17 , Issue.2 , pp. 127-134
    • Fauser, S.1
  • 11
    • 51349142276 scopus 로고    scopus 로고
    • JEDEC Standard JESD22-A104, A106.
    • JEDEC Standard JESD22-A104, A106.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.