Electric and thermal transient effects in high power optical devices

Annual IEEE Semiconductor Thermal Measurement and Management Symposium

Volumn 20, Issue , 2004, Pages 168-176

  Farkas, Gábor ^a   Haque, Shatil ^b   Wall, Frank ^b   Martin, Paul S ^b   Poppe, András ^a,c   Van Voorst Vader, Quint ^d   Bognár, György ^c  

^a MicReD Ltd   (Hungary)

^b Philips Lumileds Lighting Company   (United States)

^c BUDAPEST UNIVERSITY OF TECHNOLOGY AND ECONOMICS   (Hungary)

^d Lumileds Lighting BV   (Netherlands)

Author keywords

Combined photometric thermal measurement of power LEDs; Structure function based thermal modeling; Thermal and electro thermal simulation; Thermal transient measurement

Indexed keywords

COOLING TRANSIENT; COPPER COOLING; STRUCTURE FUNCTIONS; THERMAL TRANSIENT;

COOLING SYSTEMS; HEAT CONDUCTION; HEAT RESISTANCE; INTERMETALLICS; LIGHT EMITTING DIODES; PHOTOCURRENTS; SILICA; THERMAL EFFECTS;

OPTOELECTRONIC DEVICES;

EID: 2342621339     PISSN: 10652221     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)

1. G. Farkas, Q. van Voorst Vader, A. Poppe, Gy. Bognár: Thermal investigation of high power optical devices by transient testing, Proc. of the 9th THERMINIC, Aix-en-Provence, France, Sep 2003
2. B.S. Siegel: Measuring thermal resistance is the key to a cool semiconductor, Electronics,V.51,pp.121-126 (1978)
3. V. Székely and Tran Van Bien: Fine structure of heat flow path in semiconductor devices: a measurement and identification method, Solid-State Electronics, V.31, pp.1363-1368 (1988)
4. www.micred.com/strfunc.html
5. M.Rencz,V.Székely:Structure function evaluation of stacked dies Proc. of SEMI-THERM XX, March 2003,San Jose,CA,USA, in this issue
6. V. Székely: THERMODEL: a tool for compact dynamic thermal model generation, Microelectronics Journal, V.29, Issues 4-5, (April - May 1998)
7. G. Farkas, A. Poppe, E. Kollár, P.Stehouwer: Compact models of cooling mounts for fast board level design. Proc of SEMI-THERM XIX, March 2003, San Jose,CA,USA, pp. 255-262
8. http://www.cie.co.at/publ/list.html#standard
9. www.micred.com/t3ster.html
10. G.B. Stringfellow, M.G. Craford (ed): High Brightness Light Emitting Diodes, Semiconductors and Semimetals Volume 48, Academic Press Limited 1997