Surface roughness effects on the terahertz reflectance of pure explosive materials

Applied Physics Letters

Volumn 93, Issue 8, 2008, Pages

  Ortolani, M ^a   Lee, J S ^b   Schade, U ^a   Hubers H W ^b  

^a HAHN MEITNER INSTITUT   (Germany)

^b GERMAN AEROSPACE CENTER DLR   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVES; EXPLOSIVES; FOURIER TRANSFORMS; FRICTION; METAL ANALYSIS; NITRATION; OPTICAL CONSTANTS; PELLETIZING; REFLECTION; SURFACE PROPERTIES; SURFACE ROUGHNESS;

OBLIQUE INCIDENCE; SPECTRAL SIGNATURES; TERAHERTZ;

SURFACES;

EID: 51349164321     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2973403     Document Type: Article

References (17)

1. A. Doria, G. P. Gallerano, E. Giovenale, G. Messina, A. Lai, A. Ramundo-Orlando, V. Sposato, M. D'Arienzo, A. Perrotta, M. Romano, M. Sarti, M. R. Scarfi, I. Spassovsky, and O. Zeni, Infrared Phys. Technol. 45, 399 (2004).
2. F. Huang, B. Schulkin, H. Altan, J. F. Federici, D. Gary, R. Barat, D. Zimdars, M. Chen, and D. B. Tanner, Appl. Phys. Lett. 85, 5535 (2004).
3. Y. Chen, H. Liu, Y. Deng, D. Schauki, M. J. Fitch, R. Osiander, C. Dodson, J. B. Spicer, M. Shur, and X.-C. Zhang, Chem. Phys. Lett. 400, 357 (2004).
4. J. F. Federici, B. Schulkin, F. Huang, D. Gary, R. Barat, F. Oliveira, and D. Zimdars, Semicond. Sci. Technol. 20, 266 (2005).
5. T. Lo, I. S. Gregory, C. Baker, P. F. Taday, W. R. Tribe, and M. C. Kemp, Vib. Spectrosc. 42, 243 (2006).
6. Y. Hu, P. Huang, L. Guo, X. Wang, and C. Zhang, Phys. Lett. A 359, 728 (2006).
7. J. S. Melinger, N. Laman, and D. Grischkowsky, Appl. Phys. Lett. 93, 011102 (2008).
8. M. Born and E. Wolf, Principles of Optics (Cambridge University Press, Cambridge, 1999).
9. Y. Dikmelik, J. B. Spicer, M. J. Fitch, and R. Osiander, Opt. Lett. 31, 3653 (2006).
10. R. Piesiewicz, C. Jansen, D. Mittleman, T. Kleine-Ostmann, M. Koch, and T. Kürner, IEEE Trans. Antennas Propag. 55, 3002 (2007).
11. U. Schade, K. Holldack, P. Kuske, G. Wüstefeld, and H.-W. Hübers, Appl. Phys. Lett. 84, 1422 (2004).
12. M. Ortolani, J. S. Lee, U. Schade, H. W. Hübers, H. Richter, A. Semenov, K. Osterloh, and J. Beckmann, IEEE Proceedings Joint 31st International Conference on Infrared and Millimeter Waves and 14th International Conference on Teraherz Electronics, 2006 (unpublished), p. 457.
13. M. Ortolani, P. Calvani, S. Lupi, P. Maselli, M. Fujita, and K. Yamada, J. Opt. Soc. Am. B 22, 1994 (2005).
14. J. Pearce, Z. Jian, and D. M. Mittleman, Phys. Rev. Lett. 91, 043903 (2003).
15. R. A. Cheville, R. W. McGowan, and D. Grischkowsky, Phys. Rev. Lett. 80, 269 (1998).
16. H. Davies, Proc. Inst. Electr. Eng. 101, 209 (1954).
17. J. Humlicek and C. Bernhard, Thin Solid Films 455, 177 (2004).