Diffraction effects in infrared ellipsometry of conducting samples

Thin Solid Films

Volumn 455-456, Issue , 2004, Pages 177-182

  Humlicek J ^a   Bernhard, C ^b  

^a MASARYK UNIVERSITY   (Czech Republic)

^b MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

Author keywords

Diffraction; Infrared ellipsometry; Metals

Indexed keywords

COPPER; DIFFRACTION; INFRARED RADIATION; LIGHT REFLECTION; POLARIZATION;

CONDUCTING SAMPLES; INFRARED ELLIPSOMETRY; LIGHT WAVES;

ELLIPSOMETRY;

EID: 17144470147     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2004.01.004     Document Type: Conference Paper

References (11)

1. Sommerfeld A. Math. Ann. 47:1896;317. Sommerfeld A. Optik. 1959;Akademische Verlaggesselschaft, Leipzig. ch. 5.
2. Sommerfeld A. Math. Ann. 47:1896;317. Sommerfeld A. Optik. 1959;Akademische Verlaggesselschaft, Leipzig. ch. 5.
3. Born M., Wolf E. Principles of Optics. 1997;Cambridge University Press, Cambridge. ch. XI.
4. Morse P.M., Rubenstein P.J. Phys. Rev. 54:1938;895.
5. Hoenl H., Maue A.W., Westphal K. Theorie der Beugung. Fluegge S. Encyclopedia of Physics. 1961;Springer, Berlin.
6. Pauli W. Phys. Rev. 54:1938;924.
7. Sieber M., Pavloff N., Schmit C. Phys. Rev. E. 55:1997;2279.
8. Bouwkamp C.J. Rep. Prog. Phys. 17:1954;35.
9. Humlíček J. Ferroelectrics. 176:1996;221.
10. Lynch D.W., Hunter W.R. Palik E.D. Handbook of Optical Constants of Solids. 1985;277 Academic Press, Orlando, FL.
11. Bernhard C., Humlívek J., Keimer B. Thin Solid Films. 455-456C:2004;177-182.