Wideband electrical impedance tomography

Measurement Science and Technology

Volumn 19, Issue 9, 2008, Pages

  Nahvi, M ^a   Hoyle, B S ^a  

^a UNIVERSITY OF LEEDS   (United Kingdom)

Author keywords

Chirp waveform; Process spectroscopy; Wavelet analysis; Wideband electrical impedance tomography

Indexed keywords

ELECTRIC IMPEDANCE; ELECTRIC IMPEDANCE MEASUREMENT; ELECTRIC IMPEDANCE TOMOGRAPHY; FREQUENCY BANDS; SENSITIVITY ANALYSIS; SPECTROSCOPIC ANALYSIS; TOMOGRAPHY; WAVELET ANALYSIS; WAVELET TRANSFORMS;

CHIRP WAVEFORMS; ELECTRICAL IMPE DANCE TOMOGRAPHY (EIT); ELECTRICAL IMPEDANCE TOMOGRAPHY; PROCESS SPECTROSCOPY; PSEUDO-STATIC TESTS; SENSITIVITY TO VARIATIONS; SPECTRAL INFORMATION; WIDE FREQUENCY RANGE;

IMAGE PROCESSING;

EID: 51349110083     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/19/9/094011     Document Type: Article

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