Review of various dynamic modeling methods and development of an intuitive modeling method for dynamic systems

Nuclear Engineering and Technology

Volumn 40, Issue 5, 2008, Pages 375-386

  Shin, Seung Ki ^a   Seong, Poong Hyun ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

Bayesian network; Dynamic fault tree; Reliability graph with general gates

Indexed keywords

EID: 51249115468     PISSN: 17385733     EISSN: None     Source Type: Journal    
DOI: 10.5516/NET.2008.40.5.375     Document Type: Review

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