X-ray analysis of ZnO nanorods grown by microwave irradiation heating on ZnO films

Applied Surface Science

Volumn 254, Issue 23, 2008, Pages 7708-7711

  Ogata, K ^a   Koike, K ^a   Sasa, S ^a   Inoue, M ^a   Yano, M ^a  

^a OSAKA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

X ray diffraction; ZnO nanorods

Indexed keywords

II-VI SEMICONDUCTORS; IRRADIATION; METALLIC FILMS; MICROWAVE IRRADIATION; NANORODS; SOLUTIONS; SUBSTRATES; X RAY ANALYSIS; X RAY DIFFRACTION;

C-AXIS ORIENTATIONS; GLASS SUBSTRATES; INTENSITY RATIO; OUT-OF PLANE; XRD MEASUREMENTS; ZNO FILMS; ZNO NANOROD;

ZINC OXIDE;

EID: 51249089267     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.02.008     Document Type: Article

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