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Volumn 7, Issue 3, 2008, Pages 146-150

Simulation of ZnO diodes for application in non-volatile crossbar memories

Author keywords

Non volatile memories; Passive memories; ZnO rectifying junctions

Indexed keywords

COMPUTER NETWORKS; DIODES; SCHOTTKY BARRIER DIODES; SEMICONDUCTING ZINC COMPOUNDS; SILICON; TECHNOLOGY; ZINC ALLOYS; ZINC OXIDE;

EID: 50949120968     PISSN: 15698025     EISSN: 15728137     Source Type: Journal    
DOI: 10.1007/s10825-007-0167-1     Document Type: Article
Times cited : (24)

References (13)
  • 3
    • 4544355253 scopus 로고    scopus 로고
    • Current status of the phase change memory and its future electron devices meeting, 2003
    • IEEE
    • Lai, S.: Current status of the phase change memory and its future electron devices meeting, 2003. IEDM '03 Technical Digest. IEEE 8-10 (2003)
    • (2003) IEDM '03 Technical Digest , pp. 8-10
    • Lai, S.1
  • 13
    • 1242265497 scopus 로고    scopus 로고
    • Carrier concentration dependence of Ti/Al/Pt/Au contact resistance on n-type ZnO
    • Ip, K., Heo, Y., Baik, K., Norton, D.P., Pearton, S.J., Ren, F.: Carrier concentration dependence of Ti/Al/Pt/Au contact resistance on n-type ZnO. Appl. Phys. Lett. 84 (2004)
    • (2004) Appl. Phys. Lett. , vol.84
    • Ip, K.1    Heo, Y.2    Baik, K.3    Norton, D.P.4    Pearton, S.J.5    Ren, F.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.