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Volumn , Issue , 2008, Pages 419-427

Design optimization of custom engineered silver-nanoparticle thermal interface materials

Author keywords

Design optimization; Hot spot; Nanoparticles; Reliability; Thermal interface materials

Indexed keywords

ELECTRONIC EQUIPMENT; ELECTRONICS ENGINEERING; FIGHTER AIRCRAFT; FORMING; NANOPARTICLES; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; NUCLEAR PROPULSION; OPTIMIZATION; ORGANIC POLYMERS; RELIABILITY; SURFACE ROUGHNESS; TECHNOLOGICAL FORECASTING; THERMOANALYSIS; THERMOELECTRICITY; THERMOMECHANICAL TREATMENT;

EID: 50949112581     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ITHERM.2008.4544300     Document Type: Conference Paper
Times cited : (11)

References (8)
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  • 2
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    • R. S. Prasher, et al., "Nano and Micro Technology-Based Next Generation Package-Level Cooling Solutions", Intel Technology Journal, Vol. 9, pp. 285-296, 2005.
    • (2005) Intel Technology Journal , vol.9 , pp. 285-296
    • Prasher, R.S.1
  • 3
    • 33845571560 scopus 로고    scopus 로고
    • Materials Technologies for Thermomechanical Management of Organic Packages
    • V. Wakharkar, et al., "Materials Technologies for Thermomechanical Management of Organic Packages," Intel Technology Journal, Vol. 9, pp. 309-323, 2005.
    • (2005) Intel Technology Journal , vol.9 , pp. 309-323
    • Wakharkar, V.1
  • 4
    • 12344322625 scopus 로고    scopus 로고
    • Accelerated Thermal Cycling Guidelines for Electronic Packages in Military Avionics Thermal Environment
    • R. V. Pucha, et al., "Accelerated Thermal Cycling Guidelines for Electronic Packages in Military Avionics Thermal Environment." Transactions of the ASME, Vol. 126, pp. 256-264, 2004.
    • (2004) Transactions of the ASME , vol.126 , pp. 256-264
    • Pucha, R.V.1
  • 5
    • 0033904050 scopus 로고    scopus 로고
    • Solder Joint Fatigue Models: Review and Applicability to Chip Scale Packages
    • W. W. Lee, et al., "Solder Joint Fatigue Models: Review and Applicability to Chip Scale Packages." Microelectronics Reliability , Vol. 40, pp. 231-244, 2000.
    • (2000) Microelectronics Reliability , vol.40 , pp. 231-244
    • Lee, W.W.1
  • 6
    • 0040748904 scopus 로고    scopus 로고
    • Applying Anand Model to Represent the Viscoplastic Deformation Behavior of Solder Alloys
    • G. Z. Wang, et al., "Applying Anand Model to Represent the Viscoplastic Deformation Behavior of Solder Alloys." Journal of Electronic Packaging, Vol.123, pp. 247-253, 2001.
    • (2001) Journal of Electronic Packaging , vol.123 , pp. 247-253
    • Wang, G.Z.1
  • 7
    • 0022218769 scopus 로고
    • Constitutive Equation for Hot-Working Metals
    • L. Anand, "Constitutive Equation for Hot-Working Metals," International Journal of Plasticity, Vol. 1, pp. 213-231, 1985.
    • (1985) International Journal of Plasticity , vol.1 , pp. 213-231
    • Anand, L.1
  • 8
    • 12344252678 scopus 로고    scopus 로고
    • Interconnection Technology Research Institute ITRI, California Institute of Technology
    • Interconnection Technology Research Institute (ITRI), "Ball Grid Array Packaging Guidelines, Jet Propulsion Laboratory," 1998, California Institute of Technology.
    • (1998) Ball Grid Array Packaging Guidelines, Jet Propulsion Laboratory


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.