Growth, crystal structure, and properties of epitaxial BiSc O3 thin films

Journal of Applied Physics

Volumn 104, Issue 4, 2008, Pages

  Trolier Mckinstry, Susan ^a   Biegalski, Michael D ^b   Wang, Junling ^c   Belik, Alexei A ^d   Takayama Muromachi, Eiji ^d   Levin, Igor ^e  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

^c NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^d NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^e NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EPITAXIAL GROWTH;

EPITAXIAL THIN FILMS;

CRYSTAL STRUCTURE;

EID: 50849125394     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2964087     Document Type: Article

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