Preparation and characterization of high temperature perovskite ferroelectrics in the solid-solution (1 - x)BiScO3-xPbTiO3

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 41, Issue 4, 2002, Pages 2099-2104

  Eitel, Richard E ^a,b   Randall, Clive A ^a   Shrout, Thomas R ^a   Park, Seung Eek ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

^b Fraunhofer Technology Center Hialeah   (United States)

Author keywords

Ceramics; Curie temperature; Morphotropic phase boundary; Perovskite; Piezoelectric

Indexed keywords

CHARACTERIZATION; DIELECTRIC PROPERTIES; DIFFERENTIAL SCANNING CALORIMETRY; HIGH TEMPERATURE PROPERTIES; LATTICE CONSTANTS; PEROVSKITE; PIEZOELECTRIC MATERIALS; POSITIVE IONS; SCANNING ELECTRON MICROSCOPY; SOLID SOLUTIONS; X RAY DIFFRACTION ANALYSIS;

HIGH TEMPERATURE PIEZOELECTRICS; MORPHOTROPIC PHASE BOUNDARY; PIEZOELECTRIC COEFFICIENT;

FERROELECTRIC MATERIALS;

EID: 0036529220     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.41.2099     Document Type: Article

References (15)