Electron attachment to SF6 under well defined conditions: Comparison of statistical modeling results to experiments

Journal of Physics: Conference Series

Volumn 115, Issue 1, 2008, Pages

  Miller, Thomas M ^a   Viggiano, Albert A ^a   Troe, Jürgen ^b  

^a AIR FORCE RESEARCH LABORATORY   (United States)

^b UNIVERSITY OF GÖTTINGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 50849108187     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/115/1/012019     Document Type: Article

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