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Volumn 115, Issue 1, 2008, Pages
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Electron attachment to SF6 under well defined conditions: Comparison of statistical modeling results to experiments
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 50849108187
PISSN: 17426588
EISSN: 17426596
Source Type: Conference Proceeding
DOI: 10.1088/1742-6596/115/1/012019 Document Type: Article |
Times cited : (13)
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References (39)
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