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Volumn 115, Issue 1, 2008, Pages

Electron attachment to SF6 under well defined conditions: Comparison of statistical modeling results to experiments

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EID: 50849108187     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/115/1/012019     Document Type: Article
Times cited : (13)

References (39)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.