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Volumn 35, Issue 2, 2005, Pages 177-191

High resolution study of anion formation in low-energy electron attachment to SF6 molecules in a seeded supersonic beam

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON ENERGY LEVELS; ELECTRONS; MASS SPECTROMETRY; NEGATIVE IONS; NOZZLES; PHOTOELECTRON SPECTROSCOPY; PUMPING (LASER); SULFUR HEXAFLUORIDE;

EID: 24944516608     PISSN: 14346060     EISSN: 14346079     Source Type: Journal    
DOI: 10.1140/epjd/e2005-00230-6     Document Type: Article
Times cited : (35)

References (76)
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    • (1995) AIP Conf. Proc. No. 360 , vol.360 , pp. 267
    • Hotop, H.1    Klar, D.2    Kreil, J.3    Ruf, M.-W.4    Schramm, A.5    Weber, J.M.6
  • 43
    • 24944478207 scopus 로고
    • edited by G. Scoles (Oxford Univ. Press, New York), Chap. 2, p. 14ff
    • D.R. Miller, in Atomic and Molecular Beam Methods, edited by G. Scoles (Oxford Univ. Press, New York, 1988), Chap. 2, p. 14ff
    • (1988) Atomic and Molecular Beam Methods
    • Miller, D.R.1
  • 44
    • 24944580840 scopus 로고    scopus 로고
    • private communication
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    • (2002)
    • Buck, U.1
  • 45
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    • Dissertation, Fachbereich Physik, Univ. Kaiserslautern, Shaker Verlag (Aachen), ISBN 3-8265-3657-6
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    • (1998)
    • Schramm, A.1
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    • edited by W.R. MacGillivray, I.E. McCarthy, M.C. Standage (Bristol, Philadelphia, New York)
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    • (1992) Electronic and Atomic Collisions , pp. 599
    • Kraft, T.1    Ruf, M.-W.2    Hotop, H.3
  • 66
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    • Dissertation, Fachbereich, Univ. Kaiserslautern unpublished
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.