Characterization of low losses in optical thin films and materials

Applied Optics

Volumn 47, Issue 13, 2008, Pages

  Mühlig, Christian ^a   Triebel, Wolfgang ^a   Kufert, Siegfried ^a   Bublitz, Simon ^a  

^a LEIBNIZ INSTITUTE OF PHOTONIC TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; FILMS; FLUORESCENCE; LASER BEAM EFFECTS; LASER EXCITATION; OPTICAL COATINGS;

ABSORPTION MEASUREMENTS; ABSORPTION VALUES; FLUORESCENCE QUANTUM YIELD; LASER INDUCED FLUORESCENCE; MEASUREMENT STRATEGIES; OPTICAL THIN FILMS; RESIDUAL ABSORPTION; TRIVALENT CERIUM;

LASER MIRRORS;

EID: 50849096744     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.47.00C135     Document Type: Article

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