AES-based BIST: Self-test, test pattern generation and signature analysis

Proceedings - 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008

Volumn , Issue , 2008, Pages 314-321

  Doulcier, M ^a   Flottes, M L ^a   Rouzeyre, B ^a  

^a LIRMM   (France)

Author keywords

AES core; BIST; Secure systems

Indexed keywords

COMPACTION; COMPUTER NETWORKS; ELECTRONICS ENGINEERING; HARDWARE; INDUSTRIAL ECONOMICS; RHENIUM; RISK ASSESSMENT; STATISTICAL TESTS; TECHNICAL PRESENTATIONS;

AES CORE; BIST; SECURE SYSTEMS; SELF TESTING;

BUILT-IN SELF TEST;

EID: 50649109836     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DELTA.2008.86     Document Type: Conference Paper

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