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Volumn 15, Issue 8, 2007, Pages 545-551

Novel a-Si:H TFT pixel circuit for electrically stable top-anode light-emitting AMOLEDs

Author keywords

A Si:H; AMOLED; Pixel circuit; Reliability; TFT

Indexed keywords

COPYING; ELECTROMAGNETIC WAVES; LIGHT EMISSION; LIGHT EMITTING DIODES; ORGANIC LIGHT EMITTING DIODES (OLED); PIXELS; SEMICONDUCTING SILICON COMPOUNDS; SILICON;

EID: 50549088952     PISSN: 10710922     EISSN: None     Source Type: Journal    
DOI: 10.1889/1.2770853     Document Type: Conference Paper
Times cited : (11)

References (13)
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    • Accelerated stress testing of a-Si:H pixel circuits for AMOLED displays
    • K Sakariya, CKM Ng, P Servati, and A Nathan, "Accelerated stress testing of a-Si:H pixel circuits for AMOLED displays," IEEE Trans Electron Dev 52, No. 12, 2577 (2005).
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  • 6
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    • Recoverable residual image induced by hysteresis of thin film transistors in active matrix organic light emitting diode displays
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    • A Tagawa, T Numao, and T Ohba, "A novel digital-gray-scale driving method with a multiple addressing sequence for AMOLED displays," Proc IDW, No AMD3/OLED5-2, 279 (2004).
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    • Vt compensation performance of voltage data AMOLED pixel circuits
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.