메뉴 건너뛰기




Volumn , Issue , 2006, Pages 561-564

Breakdown statistics of polyimide at low temperatures

Author keywords

[No Author keywords available]

Indexed keywords

DISTRIBUTION FUNCTIONS; LIQUEFIED GASES; LIQUID NITROGEN; MATHEMATICAL MODELS; MONTE CARLO METHODS; MOSFET DEVICES;

EID: 50549087369     PISSN: 00849162     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CEIDP.2006.311994     Document Type: Conference Paper
Times cited : (10)

References (12)
  • 1
    • 9944228183 scopus 로고    scopus 로고
    • Aging characteristics of cryogenic insulator for development of hts transformer
    • V.-D. Nguyen, J.-M. Joung, S.-M. Baek, C-H. Lee, and S. H. Kim, "Aging characteristics of cryogenic insulator for development of hts transformer," Cryogenics, vol. 45, pp. 57-63, 2005.
    • (2005) Cryogenics , vol.45 , pp. 57-63
    • Nguyen, V.-D.1    Joung, J.-M.2    Baek, S.-M.3    Lee, C.-H.4    Kim, S.H.5
  • 2
    • 0035269784 scopus 로고    scopus 로고
    • Frequency dependent dielectric breakdown on thin polyimide films prepared by vapor deposition polymerization
    • K. Miyairi, "Frequency dependent dielectric breakdown on thin polyimide films prepared by vapor deposition polymerization," Jpn. J. Appl. Phys., vol. 40, pp. 1297-1299, 2001.
    • (2001) Jpn. J. Appl. Phys , vol.40 , pp. 1297-1299
    • Miyairi, K.1
  • 3
    • 0037301015 scopus 로고    scopus 로고
    • Breakdown voltages of polymers in temperature range 23°-250°c
    • G. Raju, A. Katebian, and S. Z. Jafri, "Breakdown voltages of polymers in temperature range 23°-250°c," IEEE Trans. Dielect. Electr. Insul., vol. 10, no. 1, pp. 117-127, 2003.
    • (2003) IEEE Trans. Dielect. Electr. Insul , vol.10 , Issue.1 , pp. 117-127
    • Raju, G.1    Katebian, A.2    Jafri, S.Z.3
  • 4
    • 0001472191 scopus 로고
    • Theoretical basis for the statistics of dielectric breakdown
    • R. M. Hill and L. A. Dissado, "Theoretical basis for the statistics of dielectric breakdown," J. Phys. C: Solid State Phys., vol. 16, pp. 2145-2156, 1983.
    • (1983) J. Phys. C: Solid State Phys , vol.16 , pp. 2145-2156
    • Hill, R.M.1    Dissado, L.A.2
  • 5
    • 0001288560 scopus 로고
    • Censored weibull statistics in the dielectric breakdown of thin oxide films
    • S. M. Rowland, R. M. Hill, and L. A. Dissado, "Censored weibull statistics in the dielectric breakdown of thin oxide films," J. Phys. C: Solid State Phys., vol. 19, pp. 6263-6385, 1986.
    • (1986) J. Phys. C: Solid State Phys , vol.19 , pp. 6263-6385
    • Rowland, S.M.1    Hill, R.M.2    Dissado, L.A.3
  • 6
    • 0002127448 scopus 로고
    • A statistical theory of the strength of materials
    • Stockholm: Generalstabens Litografiska anstalts förlag
    • W. Weibull, A statistical theory of the strength of materials, ser. Ingeniörsvetenskapsakademiens Handlingar. Stockholm: Generalstabens Litografiska anstalts förlag, 1939, no. 151.
    • (1939) ser. Ingeniörsvetenskapsakademiens Handlingar , Issue.151
    • Weibull, W.1
  • 7
    • 84987266075 scopus 로고
    • A statistical distribution function of wide applicability
    • _, "A statistical distribution function of wide applicability," J. Appl. Mech., vol. 18, pp. 293-297, 1951.
    • (1951) J. Appl. Mech , vol.18 , pp. 293-297
    • Weibull, W.1
  • 9
    • 4043098346 scopus 로고    scopus 로고
    • Failure distributions of succesive dielectric breakdown events
    • T. Pompl and M. Kerber, "Failure distributions of succesive dielectric breakdown events," IEEE. Trans. Device Mat. Rel., vol. 4, no. 2, pp. 263-267, 2005.
    • (2005) IEEE. Trans. Device Mat. Rel , vol.4 , Issue.2 , pp. 263-267
    • Pompl, T.1    Kerber, M.2
  • 10
    • 0025531419 scopus 로고
    • Theoretical basis for statistics of dielectric breakdown
    • L. A. Dissado, "Theoretical basis for statistics of dielectric breakdown," J. Phys. D: Appl. Phys., vol. 23, pp. 1582-1591, 1990.
    • (1990) J. Phys. D: Appl. Phys , vol.23 , pp. 1582-1591
    • Dissado, L.A.1
  • 12
    • 22944490539 scopus 로고    scopus 로고
    • Origin of temperature dependent conductivity in α-polyvinylidene fluoride
    • arXiv: cond-matt/0411522
    • E. Tuncer, M. Wegener, P. Frubing, and R. Gerhard-Multhaupt, "Origin of temperature dependent conductivity in α-polyvinylidene fluoride," J. Chem. Phys., vol. 122, p. 084901, 2005, arXiv: cond-matt/0411522.
    • (2005) J. Chem. Phys , vol.122 , pp. 084901
    • Tuncer, E.1    Wegener, M.2    Frubing, P.3    Gerhard-Multhaupt, R.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.