Quartz tuning-fork type AFM probe operated in anti-phase vibration mode

2006 IEEE International Symposium on Micro-Nano Mechanical and Human Science, MHS

Volumn , Issue , 2006, Pages

  Hida, H ^a   Shikida, M ^a   Fukuzawa, K ^a   Ono, A ^b   Sato, K ^a,b   Asaumi, K ^c   Iriye, Y ^c  

^a NAGOYA UNIVERSITY   (Japan)

^b Epson Toyocom Corporation   (Japan)

^c MIZUHO INFORMATION AND RESEARCH INSTITUTE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CLARIFICATION; COMPUTER NETWORKS; ERROR ANALYSIS; FOCUSED ION BEAMS; ION BOMBARDMENT; LATTICE VIBRATIONS; OXIDE MINERALS; QUARTZ; SOCIAL SCIENCES; TECHNICAL PRESENTATIONS; TUNING; VIBRATING CONVEYORS; WATER POLLUTION;

HUMAN SCIENCES; INTERNATIONAL SYMPOSIUM; TUNING FORK; VIBRATION MODES;

VIBRATIONS (MECHANICAL);

EID: 50449107629     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MHS.2006.320245     Document Type: Conference Paper

References (5)

1. H. Edwards, L. Taylor, W. Duncan, Allan J. Melmed, "Fast, high-resolution atomic force microscopy using a quartz tuning fork as actuator and sensor", Journal of Applied Physics, Vol. 82, Issue 3, pp. 980-984, 1997.
2. S. Rozhok, V. Chandrasekharm, "Application of commercially available cantilevers in tuning fork Scanning Probe Microscopy (SPM) studies", Solid State Communication, Vol. 121, Issue 12, pp. 683-686, 2002.
3. M. Kageshima, H. Jensenius, M. Dienwieble, Y. Nakayama, H. Tokumoto, S. P. Jarvis, T. H. Oosterkamp, "Noncontact atomic force microscopy in liquid environment with quartz tuning fork and carbon nanotube probe", Applied Surface Science, Vol. 188, Issues 3-4, pp. 440-444, 2001.
4. T. R. Albrecht, P. Griitter, D. Horne, D. Ruger, "Frequency modulation detection using high-Q cantilevers for enhanced force microscope sensitivity", Journal of Applied Physics, Vol. 69, Issue 2, pp. 668-673, 1991.
5. H. Hida, M. Shikida, K. Fukuzawa, A. Ono, K. Sato, K. Asaumi, Y. Iriye, and K. Sato, Proc. MEMS2005, pp. 323-326