The effect of surface stress and wetting layers on morphological instability in epitaxially strained films

Journal of Applied Physics

Volumn 96, Issue 6, 2004, Pages 3127-3133

  Savina, T V ^a   Voorhees, P W ^a   Davis, S H ^a  

^a NORTHWESTERN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FILM THICKNESS; LINEAR STABILITY; SOLID FILMS; SURFACE STRESS; WETTING LAYERS;

COMPACTION; DEFORMATION; ELASTIC MODULI; FREE ENERGY; STRESS ANALYSIS; SURFACE PHENOMENA; TENSILE TESTING; THICKNESS MEASUREMENT; WETTING;

THIN FILMS;

EID: 5044238723     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1779953     Document Type: Article

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