Wetting layer thickness and early evolution of epitaxially strained thin films

Physical Review Letters

Volumn 85, Issue 6, 2000, Pages 1286-1289

  Eisenberg, Helen R ^a   Kandel, Daniel ^a  

^a WEIZMANN INSTITUTE OF SCIENCE   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELASTICITY; EPITAXIAL GROWTH; FREE ENERGY; MATHEMATICAL MODELS; MONTE CARLO METHODS; NUMERICAL METHODS; PHASE EQUILIBRIA; RELAXATION PROCESSES; SURFACE TENSION; THICKNESS MEASUREMENT; WETTING;

EPITAXIALLY STRAINED THIN FILMS; LATTICE MISMATCH; NONLINEAR ELASTIC FREE ENERGY; PERTURBATION AMPLITUDE;

THIN FILMS;

EID: 0034250262     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.85.1286     Document Type: Article

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