EELS study of near edge fine structure in AlxGa1-xN alloys

Institute of Physics Conference Series

Volumn 179, Issue , 2004, Pages 303-306

  Radtke, G ^a   Bayle Guillemaud, P ^a   Thibault, J ^a  

^a CEA GRENOBLE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; ANISOTROPY; BACKSCATTERING; ELECTRON ENERGY LOSS SPECTROSCOPY; IONIZATION; PARAMETER ESTIMATION; SAPPHIRE; X RAY ANALYSIS;

ELECTRON ENERGY LOSS SPECTRUM (EELS); PROJECTED DENSITY OF STATES (PDOS); THICK LAYERS; X RAY ABSORPTION SPECTROSCOPY;

ALUMINUM ALLOYS;

EID: 5044224774     PISSN: 09513248     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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