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Volumn , Issue , 2007, Pages 603-606

Compact nano-electro-mechanical non-volatile memory (NEMory) for 3D integration

Author keywords

[No Author keywords available]

Indexed keywords

CYTOLOGY; ELECTRON DEVICES; METALS; OPTICAL DESIGN;

EID: 50249178598     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IEDM.2007.4419011     Document Type: Conference Paper
Times cited : (54)

References (6)
  • 5
    • 0033148674 scopus 로고    scopus 로고
    • Characterization of contact electromechanics through capacitance-voltage measurements and simulations
    • E. K. Chan, K. Garikipati, and R. W. Dutton, "Characterization of contact electromechanics through capacitance-voltage measurements and simulations," IEEE J MEMS, Vol. 8, pp. 208-217, 1999.
    • (1999) IEEE J MEMS , vol.8 , pp. 208-217
    • Chan, E.K.1    Garikipati, K.2    Dutton, R.W.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.