Young's double-slit interference experiment with electrons

American Journal of Physics

Volumn 75, Issue 11, 2007, Pages 1053-1055

  Frabboni, S ^a   Gazzadi, G C ^b   Pozzi, G ^c  

^a UNIVERSITY OF MODENA AND REGGIO EMILIA   (Italy)

^b CNR Consiglio Nazionale delle Ricerche   (Italy)

^c UNIVERSITY OF BOLOGNA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 35748976585     PISSN: 00029505     EISSN: None     Source Type: Journal    
DOI: 10.1119/1.2757621     Document Type: Article

References (8)

1. R. P. Feynman, R. B. Leighton, and M. Sands, The Feynman Lectures on Physics (Addison-Wesley, Reading, MA, 1966), Vol. 3, Chap. 1.
2. C. Jönsson, "Elektroneninterferenzen an mehreren künstlich hergestellten Feinspalten," Z. Phys. 161, 454-474 (1961)
3. [English translation: "Electron diffraction at multiple slits," Am. J. Phys. 42, 4-11 (1974)].
4. O. Donati, G. F. Missiroli, and G. Pozzi, "An experiment on electron interference," Am. J. Phys. 41, 639-644 (1973).
5. P. G. Merli, G. F. Missiroli, and G. Pozzi, "On the statistical aspect of electron interference phenomena," Am. J. Phys. 44, 306-307 (1976).
6. A. Tonomura, J. Endo, T. Matsuda, T. Kawasaki, and H. Esawa, "Demonstration of single-electron buildup of an interference pattern," Am. J. Phys. 57, 117-120(1989).
7. FIB systems are increasingly widespread in academic facilities devoted to micro-fabrication, material science, or electron microscopy. Many of these laboratories, but also FIB manufacturers or private laboratories on microelectronics diagnostics, offer FIB service activity to external users.
8. SPI Supplies (http://www.2spi.com), product number 4091SN-BA.