Extension of universal mobility curve to multi-gate MOSFETs

Technical Digest - International Electron Devices Meeting, IEDM

Volumn , Issue , 2007, Pages 703-706

  Yoshimoto, Hiroyuki ^a   Sugii, Nobuyuki ^a   Hisamoto, Digh ^a   Saito, Shin Ichi ^a   Tsuchiya, Ryuta ^a   Kimura, Shin'ichiro ^a  

^a HITACHI LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELDS; ELECTROMAGNETIC FIELD THEORY; ELECTROMAGNETIC FIELDS;

GATE TRANSISTORS; MOSFETS; NOVEL METHODS;

ELECTRON DEVICES;

EID: 50249091024     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IEDM.2007.4419043     Document Type: Conference Paper

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