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Volumn , Issue , 2008, Pages 395-398
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A new paradigm for high resolution 3D lithography
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPOSITE MICROMECHANICS;
LITHOGRAPHY;
MECHANICAL ENGINEERING;
MECHANICS;
MECHATRONICS;
MEMS;
MICROELECTROMECHANICAL DEVICES;
REACTIVE ION ETCHING;
THREE DIMENSIONAL;
3D LITHOGRAPHY;
3D MICROMACHINING;
AND MODELING;
GRAY SCALING;
GRAY-SCALE LITHOGRAPHY;
HIGH RESOLUTIONS;
INTERNATIONAL CONFERENCES;
MICRO-ELECTRO MECHANICAL SYSTEMS;
VERTICAL RESOLUTIONS;
LAWS AND LEGISLATION;
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EID: 50149109652
PISSN: 10846999
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/MEMSYS.2008.4443676 Document Type: Conference Paper |
Times cited : (1)
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References (6)
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