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Volumn 27, Issue 9, 2007, Pages 22-27

Study of EFT/B generated in primary circuit and its countermeasures

Author keywords

EFT B; Interference source; Parasitic capacitance

Indexed keywords

CAPACITANCE; ELECTRIC LINES; ELECTRIC POWER SYSTEMS; ELECTRIC SWITCHES;

EID: 34648825644     PISSN: 10066047     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (5)

References (15)
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    • Electrial fast transient burst immunity of protection equipment
    • LIANG Zhi-cheng, FU Jing-bo, LI Fu-tong, et al. Electrial fast transient burst immunity of protection equipment[J]. Automation of Electric Power Systems, 2003, 27(11): 65-68.
    • (2003) Automation of Electric Power Systems , vol.27 , Issue.11 , pp. 65-68
    • Liang, Z.-C.1    Fu, J.-B.2    Li, F.-T.3
  • 2
    • 15044355584 scopus 로고    scopus 로고
    • Research on the susceptivity on microprocessor based protection equipment
    • XIAO Bao-ming, WANG Ze-zhong, LU Bin-xian, et al. Research on the susceptivity on microprocessor based protection equipment[J]. Automation of Electric Power Systems, 2005, 29(3): 61-64.
    • (2005) Automation of Electric Power Systems , vol.29 , Issue.3 , pp. 61-64
    • Xiao, B.-M.1    Wang, Z.-Z.2    Lu, B.-X.3
  • 3
    • 34548659469 scopus 로고    scopus 로고
    • Research on electrical fast transient/burst immunity for numerical protection
    • CHENG Li-jun, DENG Hui-qiong. Research on electrical fast transient/burst immunity for numerical protection[J]. Electric Power Automation Equipment, 2002, 22(6): 5-8.
    • (2002) Electric Power Automation Equipment , vol.22 , Issue.6 , pp. 5-8
    • Cheng, L.-J.1    Deng, H.-Q.2
  • 4
    • 0035429042 scopus 로고    scopus 로고
    • The transient electromagnetic fields caused by the operation of disconnector
    • LI Qing-quan, LI Yan-ming, NIU Ya-min. The transient electromagnetic fields caused by the operation of disconnector[J]. High Voltage Engineering, 2001, 27(4): 35-37.
    • (2001) High Voltage Engineering , vol.27 , Issue.4 , pp. 35-37
    • Li, Q.-Q.1    Li, Y.-M.2    Niu, Y.-M.3
  • 5
  • 6
    • 34648869401 scopus 로고
    • IEC61000-4-4 Electromagnetic Compatibility (EMC). Part 4-4: Testing and measurement techniques-electrical fast transient/burst immunity test
    • IEC Technical Committee TC77, Geneva: IEC
    • IEC Technical Committee TC77. IEC61000-4-4 Electromagnetic Compatibility (EMC). Part 4-4: testing and measurement techniques-electrical fast transient/burst immunity test[S]. Geneva: IEC, 1995.
    • (1995)
  • 7
    • 34648877833 scopus 로고    scopus 로고
    • in Chinese
  • 8
    • 34548632589 scopus 로고    scopus 로고
    • Nanosecond-risetime high-voltage electrical fast transient/burst generator
    • WANG Yu-feng, LI Li-wei, ZOU Ji-yan, et al. Nanosecond-risetime high-voltage electrical fast transient/burst generator[J]. Automation of Electric Power Systems, 2006, 30(22): 96-99.
    • (2006) Automation of Electric Power Systems , vol.30 , Issue.22 , pp. 96-99
    • Wang, Y.-F.1    Li, L.-W.2    Zou, J.-Y.3
  • 10
    • 34648869402 scopus 로고    scopus 로고
    • in Chinese
  • 11
    • 34548625861 scopus 로고    scopus 로고
    • Model and Matlab simulation of the electrical fast transient/burst disturbance in protection and control secondary circuit
    • QIN Xiao-hui, HUANG Shao-feng. Model and Matlab simulation of the electrical fast transient/burst disturbance in protection and control secondary circuit[J]. Relay, 2006, 34(4): 17-21.
    • (2006) Relay , vol.34 , Issue.4 , pp. 17-21
    • Qin, X.-H.1    Huang, S.-F.2
  • 12
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    • A lumped winding model for use in transformer models for circuit simulation
    • BLANKEN P G. A lumped winding model for use in transformer models for circuit simulation[J]. IEEE Transactions on Power Electronics, 2001, 16(3): 445-460.
    • (2001) IEEE Transactions on Power Electronics , vol.16 , Issue.3 , pp. 445-460
    • Blanken, P.G.1
  • 14
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  • 15
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    • in Chinese


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.