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Volumn 31, Issue 16, 2007, Pages 79-82

Study on EFT/B in secondary circuit and initiative countermeasures

Author keywords

Coupling path; EFT B; Interference source; Microprocessor protection device

Indexed keywords

ELECTRIC POWER SYSTEMS; ELECTROMAGNETIC SHIELDING; EQUIVALENT CIRCUITS; TRANSIENTS;

EID: 34548610961     PISSN: 10001026     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (3)

References (12)
  • 1
    • 33749510022 scopus 로고    scopus 로고
    • Electrical fast transient burst immunity of protection equipment
    • LIANG Zhicheng, FU Jingbo, LI Futong, et al. Electrical fast transient burst immunity of protection equipment. Automation of Electric Power Systems, 2003, 27 (11): 65-68.
    • (2003) Automation of Electric Power Systems , vol.27 , Issue.11 , pp. 65-68
    • Liang, Z.1    Fu, J.2    Li, F.3
  • 2
    • 15044355584 scopus 로고    scopus 로고
    • Research on the susceptivity on microprocessor based protection equipment
    • XIAO Baoming, WANG Zezhong, LU Binxian, et al. Research on the susceptivity on microprocessor based protection equipment. Automation of Electric Power Systems, 2005, 29 (3): 61-64.
    • (2005) Automation of Electric Power Systems , vol.29 , Issue.3 , pp. 61-64
    • Xiao, B.1    Wang, Z.2    Lu, B.3
  • 3
    • 34548601683 scopus 로고    scopus 로고
    • Study on improving the immunity of SMPS to EFT/B test
    • FENG Limin, CHEN Pingping, CHEN Wei, et al. Study on improving the immunity of SMPS to EFT/B test. Automation of Electric Power Systems, 2006, 30 (5): 78-82.
    • (2006) Automation of Electric Power Systems , vol.30 , Issue.5 , pp. 78-82
    • Feng, L.1    Chen, P.2    Chen, W.3
  • 4
    • 34548659469 scopus 로고    scopus 로고
    • Research on electrical fast transient/burst immunity for numerical protection
    • CHENG Lijun, DENG Huiqiong. Research on electrical fast transient/burst immunity for numerical protection. Electric Power Automation Equipment, 2002, 22 (6): 5-8.
    • (2002) Electric Power Automation Equipment , vol.22 , Issue.6 , pp. 5-8
    • Cheng, L.1    Deng, H.2
  • 5
    • 0035429042 scopus 로고    scopus 로고
    • The transient electromagnetic fields caused by the operation of disconnector
    • LI Qingquan, LI Yanming, NIU Yamin. The transient electromagnetic fields caused by the operation of disconnector. High Voltage Engineering, 2001, 27 (4): 35-37.
    • (2001) High Voltage Engineering , vol.27 , Issue.4 , pp. 35-37
    • Li, Q.1    Li, Y.2    Niu, Y.3
  • 7
    • 34548632589 scopus 로고    scopus 로고
    • Nanosecond-rise time high-voltage electrical fast transient/burst generator
    • WANG Yufeng, LI Liwei, ZOU Jiyan, et al. Nanosecond-rise time high-voltage electrical fast transient/burst generator. Automation of Electric Power Systems, 2006, 30 (22): 96-99.
    • (2006) Automation of Electric Power Systems , vol.30 , Issue.22 , pp. 96-99
    • Wang, Y.1    Li, L.2    Zou, J.3
  • 9
    • 3042618499 scopus 로고    scopus 로고
    • Research on transient saturation of opto-couplers for electrical fast transient/burst
    • CAI Min, CHENG Lijun. Research on transient saturation of opto-couplers for electrical fast transient/burst. Automation of Electric Power Systems, 2004, 28 (8): 72-75.
    • (2004) Automation of Electric Power Systems , vol.28 , Issue.8 , pp. 72-75
    • Cai, M.1    Cheng, L.2
  • 12
    • 34548625861 scopus 로고    scopus 로고
    • Model and MATLAB simulation of the electrical fast transient/burst disturbance in protection and control secondary circuit
    • QIN Xiaohui, HUANG Shaofeng. Model and MATLAB simulation of the electrical fast transient/burst disturbance in protection and control secondary circuit. Relay, 2006, 34 (4): 17-21.
    • (2006) Relay , vol.34 , Issue.4 , pp. 17-21
    • Qin, X.1    Huang, S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.