A new subthreshold leakage model for NMOS transistor stacks

2007 IEEE North-East Workshop on Circuits and Systems, NEWCAS 2007

Volumn , Issue , 2007, Pages 972-975

  Al Hertani, Hussam ^a   Al Khalili, Dhamin ^a   Rozon, Côme ^a  

^a ROYAL MILITARY COLLEGE OF CANADA   (Canada)

Author keywords

BSIM; Estimation; Model; Static leakage; Subthreshold current; Transistor stacks

Indexed keywords

AVERAGE ERRORS; BSIM; MODEL; NEW MODEL; NMOS TRANSISTORS; NODAL VOLTAGES; SPICE SIMULATIONS; STATIC LEAKAGE; SUB-THRESHOLD LEAKAGE; SUBTHRESHOLD CURRENT; TRANSISTOR STACKS;

ESTIMATION; LEAKAGE CURRENTS;

CMOS INTEGRATED CIRCUITS;

EID: 50049124817     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NEWCAS.2007.4487994     Document Type: Conference Paper

References (5)

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