Analysis of x-ray linear dichroism spectra for NiO thin films grown on vicinal Ag(001)

Physical Review B - Condensed Matter and Materials Physics

Volumn 78, Issue 6, 2008, Pages

  Wu, Y Z ^a,b   Zhao, Y ^c   Arenholz, E ^d   Young, A T ^d   Sinkovic, B ^c   Won, C ^e   Qiu, Z Q ^b  

^a FUDAN UNIVERSITY   (China)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c UNIVERSITY OF CONNECTICUT   (United States)

^d LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^e Kyung Hee University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 50049114733     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.78.064413     Document Type: Article

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