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Volumn 14, Issue 9-11, 2008, Pages 1335-1342
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A Si stencil mask for deep X-ray lithography fabricated by MEMS technology
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Author keywords
[No Author keywords available]
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Indexed keywords
ASPECT RATIO;
COMPOSITE MICROMECHANICS;
EXPERIMENTS;
LITHOGRAPHY;
MEMS;
MICROELECTROMECHANICAL DEVICES;
NONMETALS;
OPTICAL DESIGN;
PHOTORESISTS;
SILICON;
TECHNOLOGY;
X RAY LITHOGRAPHY;
ADVANCED SCIENCE;
BEAM LINES;
DEEP X-RAY LITHOGRAPHY;
HYDROFLUOROETHER;
LINE WIDTHS;
LINE/SPACE PATTERNING;
MEMS FABRICATION;
MEMS TECHNOLOGY;
SI-WAFER;
STENCIL MASKS;
X-RAY EXPOSURE;
SILICON WAFERS;
ABSORBERS;
ETCHING;
ETHERS;
EXPERIMENTATION;
GOLD;
LITHOGRAPHY;
NONMETALS;
OPTICAL INSTRUMENTS;
POLYIMIDES;
SILICON;
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EID: 49949119431
PISSN: 09467076
EISSN: None
Source Type: Journal
DOI: 10.1007/s00542-007-0513-z Document Type: Conference Paper |
Times cited : (4)
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References (5)
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