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Volumn 16, Issue 7, 2008, Pages 4547-4558

Influence of surface reflective properties on differential interference contrast microscopy

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHM; ARTICLE; COMPUTER ASSISTED DIAGNOSIS; IMAGE ENHANCEMENT; METHODOLOGY; PHASE CONTRAST MICROSCOPY; REFRACTOMETRY;

EID: 49849098718     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.16.004547     Document Type: Article
Times cited : (2)

References (12)
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    • Quantitative surface topography determination by Nomarski reflection microscopy. I. Theory
    • D. L. Lessor, J. S. Hartman, R. L. Gordon, " Quantitative surface topography determination by Nomarski reflection microscopy. I. Theory," J. Opt. Soc. Am. 69, 357-366 (1979).
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    • Galbraith, W.1    David, G.B.2
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    • Confocal differential interference contrast (DIC) microscopy: Including a theoretical analysis of conventional and confocal DIC imaging
    • C. J. Cogswell and C. J. R. Sheppard, "Confocal differential interference contrast (DIC) microscopy: including a theoretical analysis of conventional and confocal DIC imaging," J. Microsc. 165, 81-101 (1992).
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    • Cogswell, C.J.1    Sheppard, C.J.R.2
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    • Theoretical development and experimental evaluation of imaging models for differential-interference-contrast microscopy
    • C. Preza and D. L. Snyder, "Theoretical development and experimental evaluation of imaging models for differential-interference-contrast microscopy," J. Opt. Soc. Am. A 16, 2185-2199 (1999).
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  • 9
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    • Polarization-modulated differential-interference contrast microscopy with a variable retarder
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.