Grain boundary migration during abnormal grain growth in nanocrystalline Ni

Materials Science and Engineering: A

Volumn 494, Issue 1-2, 2008, Pages 232-238

  Hibbard, G D ^a   Radmilovic, V ^b   Aust, K T ^a   Erb, U ^a  

^a UNIVERSITY OF TORONTO   (Canada)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

Grain growth; In situ electron microscopy; Nanostructured materials; Nickel

Indexed keywords

GRAIN BOUNDARIES; GRAIN GROWTH; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; NANOCRYSTALS; NANOSTRUCTURED MATERIALS;

ABNORMAL GRAIN GROWTH; DISCRETE STEP; EX-SITU ANNEALING; GRAIN BOUNDARY MIGRATIONS; IN-SITU ELECTRON MICROSCOPY; IN-SITU TRANSMISSION ELECTRON MICROSCOPIES; NANOCRYSTALLINE NI; NON-UNIFORM; TRANSFORMATION MECHANISMS;

NICKEL;

EID: 49849094752     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.msea.2008.04.054     Document Type: Article

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