Structural and electrical characterization of chemical-solution-derived Bi5FeTi3O15 thin films

Journal of Physics D: Applied Physics

Volumn 41, Issue 15, 2008, Pages

  Wang, Wei ^a   Sun, Jia Bao ^a   Mao, Xiang Yu ^a   Chen, Xiao Bing ^a  

^a YANGZHOU UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

IRON; THICK FILMS;

AURIVILLIUS PHASE; CHEMICAL-; ELECTRICAL CHARACTERIZATIONS; THIN FILMS;

BISMUTH PLATING;

EID: 49749152065     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/41/15/155418     Document Type: Article

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