An open-loop flow control scheme based on the accurate global information of on-chip communication

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2008, Pages 1244-1249

  Kwon, Woo Cheol ^a   Hong, Sung Min ^a   Yoo, Sungjoo ^a   Min, Byeong ^a   Choi, Kyu Myung ^a   Eo, Soo Kwan ^a  

^a SAMSUNG Electronics   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

AREA OVERHEAD; CONTROL SCHEMES; FLOW-THROUGH; GLOBAL INFORMATIONS; HIGH-BANDWIDTH; INDUSTRIAL STRENGTH; LOW-LATENCY; MEMORY ACCESSES; MEMORY BANDWIDTHS; OFF-CHIP MEMORIES; ON-CHIP BUFFERS; ON-CHIP COMMUNICATIONS; ON-CHIP NETWORK; OPEN LOOPS; SELECTIVE BUFFERING; SYNTHETIC TESTS;

BANDWIDTH; COMMUNICATION; DATA TRANSFER; DIGITAL TELEVISION; ELECTRIC NETWORK TOPOLOGY; EMBEDDED SYSTEMS; FLOW CONTROL; INDUSTRIAL ENGINEERING; TELECOMMUNICATION SYSTEMS; TELEVISION BROADCASTING; TESTING;

DESIGN OF EXPERIMENTS;

EID: 49749135050     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2008.4484849     Document Type: Conference Paper

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