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Volumn 76, Issue 3, 2003, Pages 243-256
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Recombination processes and lifetime measurements in silicon photovoltaics
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Author keywords
Lifetime; Photovoltaics; Recombination process; Shockley Read Hall process; Si
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Indexed keywords
COST EFFECTIVENESS;
CURRENT DENSITY;
PHOTOCONDUCTIVITY;
SHORT CIRCUIT CURRENTS;
SILICON WAFERS;
RECOMBINATION PROCESS;
PHOTOVOLTAIC CELLS;
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EID: 0037474788
PISSN: 09270248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0927-0248(02)00277-5 Document Type: Article |
Times cited : (14)
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References (7)
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