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Volumn 25, Issue 8, 2008, Pages 3005-3008

Influence of ring oxidation-induced stack faults on efficiency in silicon solar cells

Author keywords

[No Author keywords available]

Indexed keywords

DIFFUSION; EFFICIENCY; OXIDATION; POINT DEFECTS;

EID: 49749098493     PISSN: 0256307X     EISSN: 17413540     Source Type: Journal    
DOI: 10.1088/0256-307X/25/8/073     Document Type: Article
Times cited : (11)

References (19)
  • 6
    • 49749092813 scopus 로고
    • Fischer H et al 1973 Proc. the 10th IEEE Photovoltaic Specialists Conf. (New York: IEEE) p 404
    • (1973) , pp. 404
    • Fischer, H.1    Al, E.2
  • 7
    • 49749150213 scopus 로고    scopus 로고
    • Aberle A G et al 1997 Proc. the IEEE 26th Photovoltaic Specialists Conf. (New York: IEEE) p 13
    • (1997) , pp. 13
    • Aberle, A.G.1    Al, E.2
  • 9
    • 49749101341 scopus 로고
    • Haddad H et al 1992 Proceed. the 1992 Int. Reliability Physics Symp. (San Diego) p 85 31 March 1992)
    • (1992) , pp. 85
    • Haddad, H.1    Al, E.2
  • 19
    • 49749119269 scopus 로고    scopus 로고
    • Froitzheim A et al 2003 Proc. 3rd World Conf. on Photovoltaic Energy Conversion (Osaka, Japan) p 279 12 May 2003)
    • (2003) , pp. 279
    • Froitzheim, A.1    Al, E.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.