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Volumn 25, Issue 8, 2008, Pages 3005-3008
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Influence of ring oxidation-induced stack faults on efficiency in silicon solar cells
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Author keywords
[No Author keywords available]
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Indexed keywords
DIFFUSION;
EFFICIENCY;
OXIDATION;
POINT DEFECTS;
CRYSTAL SILICON;
DIFFUSION PROCESS;
EFFICIENCY LOSS;
INTERSTITIAL POINT DEFECTS;
MINORITY CARRIERS DIFFUSION LENGTH;
PHOSPHORUS DIFFUSION;
SELF INTERSTITIALS;
SILICON OXIDATION;
STRONG CORRELATION;
SILICON SOLAR CELLS;
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EID: 49749098493
PISSN: 0256307X
EISSN: 17413540
Source Type: Journal
DOI: 10.1088/0256-307X/25/8/073 Document Type: Article |
Times cited : (11)
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References (19)
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