Improved simple simulation models for semiconductor wafer factories

Proceedings - Winter Simulation Conference

Volumn , Issue , 2007, Pages 1708-1712

  Rose, Oliver ^a  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY; ELECTRONICS INDUSTRY; MICROELECTRONICS; OPTICAL DESIGN; SEMICONDUCTOR MATERIALS;

AUTOMATED TRANSPORT; COMPLEX ENVIRONMENTS; COMPLEX PRODUCTION; CYCLE TIME; CYCLE-TIME DISTRIBUTION; MATERIAL FLOW CONTROL; PRODUCT-VARIETY; SEMI-CONDUCTOR WAFER; SEMICONDUCTOR WAFER FABRICATION; SIMPLE MODELING; SIMULATION MODELLING; SYSTEM COMPLEXITY; WAFER-FABS;

CHLORINE COMPOUNDS;

EID: 49749083070     PISSN: 08917736     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/WSC.2007.4419793     Document Type: Conference Paper

References (5)

1. Rose, O. 1998. WIP evolution of a semiconductor factory after a bottleneck work center breakdown. In Proceedings of the 1998 Winter Simulation Conference, 997-1003
2. Rose, O. 1999a. Estimation of the cycle time distribution of a wafer fab by a simple simulation model. In Proceedings of the 1999 SMOMS (1999 WMC), 133-138.
3. Rose, O. 1999b. CONLOAD - A new lot release rule for semiconductor wafer fabs. In Proceedings of the 1999 Winter Simulation Conference, 850-855.
4. Rose, O. 2000. Why do simple wafer fab models fail in certain scenarios? In Proceedings of the 2000 Winter Simulation Conference, 1481-1490.
5. Rose, O. 2007. Improving the accuracy of simple simulation Models for complex production systems. In Proceedings of the 2007 INFORMS Simulation Society Research Workshop, Fontainebleau, July 5-7, 2007.