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Journal of the Korean Physical Society

Volumn 53, Issue 1, 2008, Pages 451-460

Optical properties of Ge-doped ZnO thin films studied with spectroscopic ellipsometry

(6) Baek, Seoung Ho a Lee, Do Kyu a Kang, Tae Dong a Choi, Suk Ho a Lee, Hosun a Eom, Seung Hwan a

a Kyung Hee University (South Korea)

Author keywords

Annealing; Band gap; Dielectric function; Ellipsometry; Ge doping; ZnO

Indexed keywords

EID: 49649093153 PISSN: 03744884 EISSN: None Source Type: Journal
DOI: 10.3938/jkps.53.451 Document Type: Conference Paper

Times cited : (3)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.