Backscattered electron imaging in the scanning electron microscope: The use of either: (A) high incident energy or (b) an array detector

Microscopy and Microanalysis

Volumn 14, Issue SUPPL. 2, 2008, Pages 120-121

  Gignac, L M ^a   Wells, O C ^a   Hu, C K ^a   Bruley, J ^a   Murray, C E ^a   Frye, A ^b  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 49549121085     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927608084948     Document Type: Conference Paper

References (2)

1. L.M. Gignac, M. Kawasaki, S.H. Boettcher & O.C.Wells, J. Appl. Phys., 97, 2005, 114506-14.
2. O.C. Wells, L.M. Gignac, C.E. Murray, A. Frye, & J. Bruley, Scanning, 28, 2006, p. 27-31.