Repetitive grain boundary chemical analysis by atom probe microscopy

Microscopy and Microanalysis

Volumn 14, Issue SUPPL. 2, 2008, Pages 1018-1019

  Larson, D J ^a   Clifton, P H ^a   Alvis, R L ^a   Olson, D P ^a   Weng, J ^a   Gerstl, S A ^a   Chen, F ^b  

^a Imago Scientific Instruments   (United States)

^b WUHAN IRON AND STEEL GROUP CORPORATION   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 49549111145     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927608083220     Document Type: Conference Paper

References (8)

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5. D. Lawrence, K. Thompson and D. J. Larson, Micro. Microanal 12(suppl. 2) (2006) 1740CD.
6. D. J. Larson et al., Ultramicroscopy 79 (1999) 287.
7. K. Thompson et al. Ultramicroscopy 107 (2006) 131.
8. M. K. Miller, et al., Micro. Microanal 13(6) (2007) 428.