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Volumn , Issue , 2008, Pages 762-767

Analog circuit simulation using range arithmetics

Author keywords

[No Author keywords available]

Indexed keywords

CHLORINE COMPOUNDS; CIRCUIT SIMULATION; COMPUTER AIDED DESIGN; CORRELATION METHODS; DIGITAL ARITHMETIC; DIGITAL INTEGRATED CIRCUITS; ELECTRIC NETWORK ANALYSIS; INDUSTRIAL ENGINEERING; MANAGEMENT SCIENCE; MATHEMATICAL MODELS; MONTE CARLO METHODS; NETWORKS (CIRCUITS);

EID: 49549103940     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ASPDAC.2008.4484053     Document Type: Conference Paper
Times cited : (41)

References (14)
  • 3
    • 0026929130 scopus 로고
    • Generation of correlated parameters for statistical circuit simulation
    • K. S. Eshbaugh. Generation of correlated parameters for statistical circuit simulation. IEEE Trans. on CAD of Integrated Circuits and Systems, 11(10):1198-1206, 1992.
    • (1992) IEEE Trans. on CAD of Integrated Circuits and Systems , vol.11 , Issue.10 , pp. 1198-1206
    • Eshbaugh, K.S.1
  • 4
    • 0034262685 scopus 로고    scopus 로고
    • True Worst-Case Circuit Tolerance Analysis Using Genetic Algorithms and Affine Arithmetic
    • N. Femia and G. Spagnuolo. True Worst-Case Circuit Tolerance Analysis Using Genetic Algorithms and Affine Arithmetic. IEEE Transactions on Circuits and Systems, 47(9), 2000.
    • (2000) IEEE Transactions on Circuits and Systems , vol.47 , Issue.9
    • Femia, N.1    Spagnuolo, G.2
  • 7
    • 0026938266 scopus 로고
    • Bounding the solution of interval linear equations
    • E. R. Hansen. Bounding the solution of interval linear equations. SIAM J. Numer. Anal., 29(5):1493-1503, 1992.
    • (1992) SIAM J. Numer. Anal , vol.29 , Issue.5 , pp. 1493-1503
    • Hansen, E.R.1
  • 8
    • 0021507985 scopus 로고    scopus 로고
    • D. E. Hocevar, P. Yang, T. N. Trick, and B. D. Epler. Transient Sensitivity Computation for MOSFET Circuits. In IEEE Transactions on CAD, 4, Issue 4, pages 609-620. IEEE press, Oct 1985.
    • D. E. Hocevar, P. Yang, T. N. Trick, and B. D. Epler. Transient Sensitivity Computation for MOSFET Circuits. In IEEE Transactions on CAD, Vol. 4, Issue 4, pages 609-620. IEEE press, Oct 1985.
  • 9
    • 0036961704 scopus 로고    scopus 로고
    • Worst-Case Tolerance Analysis of Linear DC and AC Electric Circuits
    • L. Kolev. Worst-Case Tolerance Analysis of Linear DC and AC Electric Circuits. IEEE Transactions on Circuits and Systems, 49(12), 2002.
    • (2002) IEEE Transactions on Circuits and Systems , vol.49 , Issue.12
    • Kolev, L.1
  • 10
    • 12344296927 scopus 로고    scopus 로고
    • Extensions of affine arithmetic: Application to unconstrained global optimization
    • F. Messine. Extensions of affine arithmetic: Application to unconstrained global optimization. In Journal of Universal Computer Science, Vol. 8, Issue 11, pages 992-1015, 2002.
    • (2002) Journal of Universal Computer Science , vol.8 , Issue.11 , pp. 992-1015
    • Messine, F.1
  • 11
    • 0004293209 scopus 로고
    • Prentice-Hall, Englewood Cliffs, NJ
    • R. E. Moore. Interval Analysis. Prentice-Hall, Englewood Cliffs, NJ, 1966.
    • (1966) Interval Analysis
    • Moore, R.E.1
  • 14
    • 0034242052 scopus 로고    scopus 로고
    • Worst Case Tolerance Analysis of Linear Analog Circuits Using Sensitivity Bands
    • M. W. Tian and C.-J. Shi. Worst Case Tolerance Analysis of Linear Analog Circuits Using Sensitivity Bands. IEEE Transactions on Circuits and Systems, 47(8), 2000.
    • (2000) IEEE Transactions on Circuits and Systems , vol.47 , Issue.8
    • Tian, M.W.1    Shi, C.-J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.