True worst-case circuit tolerance analysis using genetic algorithms and affine arithmetic

IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications

Volumn 47, Issue 9, 2000, Pages 1285-1296

  Femia, Nicola ^a   Spagnuolo, Giovanni ^a  

^a UNIVERSITY OF SALERNO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN; FUNCTION EVALUATION; GENETIC ALGORITHMS; ITERATIVE METHODS; MONTE CARLO METHODS; SIMULATED ANNEALING;

AFFINE ARITHMETIC; TRUE WORST-CASE CIRCUIT TOLERANCE ANALYSIS;

ELECTRIC NETWORK ANALYSIS;

EID: 0034262685     PISSN: 10577122     EISSN: None     Source Type: Journal    
DOI: 10.1109/81.883323     Document Type: Article

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