|
Volumn 4, Issue 1, 2007, Pages 78-81
|
Deep ridge GaN cw-laser diodes
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ACTIVE REGION;
ANGLE-OF-INCIDENCE;
BLUE LASERS;
CHEMICAL ASSISTED ION BEAM ETCHING;
CW LASERS;
DEVICE PERFORMANCES;
GAN BASED LASER DIODES;
GAS FLUXING;
HOMOEPITAXIAL;
INTERNATIONAL SYMPOSIUM;
LASER DIODES;
PROCESS PARAMETERS;
RIDGE WAVE-GUIDE;
SPECTRAL REGIONS;
ELECTRIC CONDUCTORS;
ETCHING;
GALLIUM ALLOYS;
GALLIUM NITRIDE;
ION BOMBARDMENT;
LASERS;
LIGHT EMISSION;
LIGHT EMITTING DIODES;
LIGHT SOURCES;
SEMICONDUCTING GALLIUM;
DIODES;
|
EID: 49549098400
PISSN: 18626351
EISSN: None
Source Type: Journal
DOI: 10.1002/pssc.200673564 Document Type: Conference Paper |
Times cited : (8)
|
References (2)
|