Ultrafast dynamic ellipsometry measurements of early time laser ablation of titanium thin films

Applied Physics A: Materials Science and Processing

Volumn 92, Issue 4, 2008, Pages 761-766

  Bolme, C A ^a   Funk, D J ^b  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABLATION; CHLORINE COMPOUNDS; DYNAMICS; ELLIPSOMETRY; LASER ABLATION; LASERS; OPTICAL PROPERTIES; PULSED LASER DEPOSITION; REFRACTIVE INDEX; THICK FILMS; THIN FILMS; TITANIUM;

ABLATION DYNAMICS; COMPLEX REFRACTIVE INDEX; EXPANDING PLASMAS; INCIDENT ANGLES; ONE-DIMENSIONAL; OPTICAL DETONATORS; P-POLARIZED; PICO SECONDS; SINGLE SHOT; SPECTRAL INTERFEROMETRY; TIME ENCODING; TIME-DEPENDENT; TIME-RESOLVED; TITANIUM THIN FILMS; ULTRAFAST DYNAMIC ELLIPSOMETRY;

PULSED LASER APPLICATIONS;

EID: 49449086900     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s00339-008-4612-1     Document Type: Article

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