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Volumn 16, Issue , 2004, Pages 397-400

Trench power MOSFET lowside switch with optimized integrated schottky diode

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC CONVERTERS; ELECTRIC RECTIFIERS; INTEGRATED CIRCUITS; LEAKAGE CURRENTS; SCHOTTKY BARRIER DIODES; SEMICONDUCTOR JUNCTIONS; SWITCHING CIRCUITS; WAVEFORM ANALYSIS;

EID: 4944238509     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/wct.2004.240290     Document Type: Conference Paper
Times cited : (28)

References (15)
  • 1
    • 0041649575 scopus 로고
    • High -frequency high -density converters for distributed power supply systems
    • April
    • J. G. Kassakian, M. F. Schlecht,"High -frequency high -density Converters for distributed power supply systems, "Proceedings of the IEEE, Vol. 76, No. 4, pp. 362-376, April 1988.
    • (1988) Proceedings of the IEEE , vol.76 , Issue.4 , pp. 362-376
    • Kassakian, J.G.1    Schlecht, M.F.2
  • 4
    • 0020888043 scopus 로고
    • Improving the reverse recovery of power MOSFET integral diodes by electron irradiation
    • December
    • B.J. Baliga, J.P. Walden,"Improving the reverse recovery of power MOSFET integral diodes by electron irradiation," Solid Stale Electronics, Vol. 26, No. 12 pp. 1133-1141, December 1983.
    • (1983) Solid Stale Electronics , vol.26 , Issue.12 , pp. 1133-1141
    • Baliga, B.J.1    Walden, J.P.2
  • 5
    • 0041672231 scopus 로고    scopus 로고
    • Fast reverse recovery body diode in high-voltage VDMOSFET using cell-distributed schottky contacts
    • May
    • X. Cheng, J.K.O. Sin, B. Kang, C. Feng, Y. Wu, X. Liu,"Fast reverse recovery body diode in high-voltage VDMOSFET using cell-distributed schottky contacts", IEEE Transactions on Electron Devices, Vol. 50, No. 5, pp. 1422-1425, May 2003.
    • (2003) IEEE Transactions on Electron Devices , vol.50 , Issue.5 , pp. 1422-1425
    • Cheng, X.1    Sin, J.K.O.2    Kang, B.3    Feng, C.4    Wu, Y.5    Liu, X.6
  • 6
    • 0032122110 scopus 로고    scopus 로고
    • Conduction power loss in MOSFET synchronous rectifier with parallel-connected schottky barrier diode
    • July
    • N. Yamashita, N. Murakami, T. Yachi," Conduction power loss in MOSFET synchronous rectifier with parallel-connected schottky barrier diode," IEEE Transactions an Power Electronics, Vol. 13, No. 4, pp. 667-673, July 1998.
    • (1998) IEEE Transactions An Power Electronics , vol.13 , Issue.4 , pp. 667-673
    • Yamashita, N.1    Murakami, N.2    Yachi, T.3
  • 7
    • 0025419524 scopus 로고
    • Monolithically integrated power MOSEFT and schottky diode with improved reverse recovery characteristics
    • April
    • K. Shenai, B.J. Baliga, "Monolithically integrated power MOSEFT and schottky diode with improved reverse recovery characteristics," IEEE Transactions on Electron Devices, Vol. 37, No. 4, pp. 1167-1169, April 1990.
    • (1990) IEEE Transactions on Electron Devices , vol.37 , Issue.4 , pp. 1167-1169
    • Shenai, K.1    Baliga, B.J.2
  • 9
    • 0026977199 scopus 로고
    • On the reverse blocking characteristics of schottky power diodes
    • December
    • S.L. Tu, B.J. Baliga, "On the reverse blocking characteristics of schottky power diodes," IEEE Transactions on Electron Devices. Vol. 39, No. 12, pp.2813-2814, December 1992.
    • (1992) IEEE Transactions on Electron Devices , vol.39 , Issue.12 , pp. 2813-2814
    • Tu, S.L.1    Baliga, B.J.2
  • 10
    • 0023999128 scopus 로고
    • Current transport mechanisms in atomically abrupt metal-semiconductor interfaces
    • April
    • K. Shenai, R. W. Dutton, "Current transport mechanisms in atomically abrupt metal-semiconductor interfaces," IEEE Transactions on Electron Devices, Vol. 35, No. 4, pp. 468-482, April 1988.
    • (1988) IEEE Transactions on Electron Devices , vol.35 , Issue.4 , pp. 468-482
    • Shenai, K.1    Dutton, R.W.2
  • 11
    • 0031621378 scopus 로고    scopus 로고
    • Experimental Investigation of dependence of electrical characteristics of device parameters in trench MOS barrier schottky diodes
    • T. Sakai, S. Matsumoto, T. Yachi, "Experimental Investigation of dependence of electrical characteristics of device parameters in trench MOS barrier schottky diodes," International Symposium on Power Semiconductors and ICs, Technical Digest, pp. 293-296, 1998.
    • (1998) International Symposium on Power Semiconductors and ICs, Technical Digest , pp. 293-296
    • Sakai, T.1    Matsumoto, S.2    Yachi, T.3
  • 12
    • 0004884810 scopus 로고
    • Very low forward drop JBS rectifiers fabricated using submicron technology
    • November
    • M. Mehrotra, B. J. Baliga,"Very low forward drop JBS rectifiers fabricated using submicron technology," IEEE Transactions on Electron Devices. Vol. 40, No. 11, pp. 2131-2132, November 1993.
    • (1993) IEEE Transactions on Electron Devices , vol.40 , Issue.11 , pp. 2131-2132
    • Mehrotra, M.1    Baliga, B.J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.