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Volumn 85, Issue 10, 2004, Pages 1730-1732
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Electrical characterization of Cd/CdTe Schottky barrier diodes
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Author keywords
[No Author keywords available]
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Indexed keywords
BUFFER LAYERS;
METAL LAYERS;
ROOM TEMPERATURE;
X RAY DETECTORS;
ACTIVATION ENERGY;
CADMIUM;
CURRENT DENSITY;
DEPOSITION;
ELECTRIC POTENTIAL;
ELECTRON BEAMS;
ELECTRON DIFFRACTION;
ELECTROOPTICAL DEVICES;
LATTICE CONSTANTS;
LIGHT ABSORPTION;
MOLECULAR BEAM EPITAXY;
PHOTOEMISSION;
SILICON WAFERS;
SOLAR CELLS;
THERMIONIC EMISSION;
SCHOTTKY BARRIER DIODES;
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EID: 4944230864
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1784873 Document Type: Article |
Times cited : (10)
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References (19)
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