High-quality as-grown MgB2 thin-film fabrication at a low temperature using an in-plane-lattice near-matched epitaxial-buffer layer

Journal of Applied Physics

Volumn 96, Issue 6, 2004, Pages 3580-3582

  Sakata, O ^a   Kimura, S ^a   Takata, M ^a   Yata, S ^b   Kato, T ^b   Yamanaka, K ^b   Yamada, Y ^c   Matsushita, A ^d   Kubo, S ^b  

^a JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^b SHIMANE UNIVERSITY   (Japan)

^c NIIGATA UNIVERSITY   (Japan)

^d NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; DEPOSITION; ELECTRON BEAMS; EPITAXIAL GROWTH; EVAPORATION; LATTICE CONSTANTS; LOW TEMPERATURE EFFECTS; MAGNESIUM COMPOUNDS; MAGNETIZATION; MICROELECTRONICS; SAPPHIRE; SQUIDS; SUPERCONDUCTIVITY; SYNCHROTRONS; TITANIUM; X RAY DIFFRACTION;

BUFFER LAYERS (BL); IN-PLANE-LATTICE SPACINGS; THIN-FILM FABRICATION; X-RAY MEASUREMENTS;

THIN FILMS;

EID: 4944228308     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1777805     Document Type: Article

References (8)

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