Nanoscale structures: Lability, length scales, and fluctuations

MRS Bulletin

Volumn 29, Issue 9, 2004, Pages 621-629

  Williams, Ellen D ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

Fluctuations; Lability; Mass transport; Morphology; Nanocrystals; Nanostructure; Scanned probe microscopy; Stability

Indexed keywords

MATERIALS SCIENCE; NANOTECHNOLOGY; RANDOM PROCESSES; SCANNING ELECTRON MICROSCOPY; STATISTICAL MECHANICS; THERMODYNAMIC PROPERTIES; TRANSMISSION ELECTRON MICROSCOPY;

MASS TRANSPORT; NANOCRYSTALS; NANOSTRUCTURES; SCANNED PROBE MICROSCOPY; STRUCTURE FLUCTUATIONS; STRUCTURE LIABILITY;

NANOSTRUCTURED MATERIALS;

EID: 4944226719     PISSN: 08837694     EISSN: None     Source Type: Journal    
DOI: 10.1557/mrs2004.182     Document Type: Review

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